Test system for opto-electronical components. 76 I/O-Chips (LED phototransistors)

The system tests 76 I/O-Chips in a single measurement. Every chip is triggered and the response signal is analysed. Tolerances of the components are checked and the measured data is provided to the quality assurance system where it is statistical evaluated.

 Technical specifications

• Test adaptor:                        manual INGUN-Adaptor
• Test pin count:                     304 exchangeable pins
  
• Input:                                      80 A/D-Converter ports; 12bit
• Output:                                   7x11 matrix for single component  access
• Adaptor control:                   2 BASIC-Tiger multitasking computer components
• Adaptor connection:           2 RS232 38kBaud
• Data Evaluation system:   C++ Win2000 application
• Test sample holder:           Vakuum exhaust

Software features

• Operating system:      MS Win2000
• data analysis:              compare to limits, calculate avarage values, statistical distribution
• data format:                  ASCII
  

Download datasheet(german only):  EOP1.pdf (837.00 KB)